Self-Nulling Eddy Current Probe for Surface and Subsurface Flaw Detection

1994 
An eddy current probe which provides a null-signal in the presence of unflawed material without the need for any balancing circuitry has been developed at NASA Langley Research Center. Such a unique capability of the probe reduces set-up time, eliminates tester configuration errors, and decreases instrumentation requirements. The probe is highly sensitive to surface breaking fatigue cracks, and shows excellent resolution for the measurement of material thickness, including material loss due to corrosion damage. The presence of flaws in the material under test causes an increase in the extremely stable and reproducible output voltage of the probe. The design of the probe and some examples illustrating its flaw detection capabilities are presented.
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