Old Web
English
Sign In
Acemap
>
Paper
>
Two-stage degradation of submicron LDD n-MOSFETs by 1/f noise, charge pumping, and drain current measurements
Two-stage degradation of submicron LDD n-MOSFETs by 1/f noise, charge pumping, and drain current measurements
1997
Serguei Okhonin
L. Ren
M. Ilegems
Keywords:
Analytical chemistry
Materials science
Noise generator
Charge pump
Electronic engineering
Noise measurement
Burst noise
Flicker noise
Voltage
Noise (electronics)
Infrasound
Degradation (geology)
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]