Low-temperature THz imaging of thin high-temperature superconductor films

We demonstrate an imaging system capable of performing spatially resolved analysis in the THz frequency range at temperatures down to 10 K. The demonstrated time-resolved THz imaging system is applied for the high-frequency characterization of thin high-temperature superconductor (HTSC) films. It is shown that this low-temperature analytic system enables to quantitatively assess the quality of growth and structuring processes of such films, and consequently can be applied to support the systematic development and optimization of HTSC based components.