Study of Domain Switching Using Piezoresponse Force Microscopy in Ca0.4Sr0.6Bi4Ti4O15 Thin Film for Electromechanical Applications

An attempt has been made to synthesize (Ca0.4Sr0.6)Bi4Ti4O15(CSBT) thin film using pulsed laser deposition (PLD) and successfully optimized the deposition conditions. A good quality film with the desired phase is obtained at a substrate temperature of 650 oC based on phase, composition and morphology studies. Highly c-axis oriented films with average thickness 330-400 nm and an average grain size 40-65 nm has been found. Piezoresponse force microscopy (PFM) showed a complete domain reversal using switching spectroscopy. A comparatively high effective d33* value as ~120 pm/V has been achived. The results suggest that CSBT has a great potential in electromechanical applications.