A novel test environment for template based QDI asynchronous circuits

In this paper, we propose an efficient test environment for template based asynchronous circuits. This test environment consists of two major parts: fault simulation and test pattern generation. The fault simulation is based on exploring fault effect on quasi-delay insensitive asynchronous circuits that detects any changes in sequences of predefined signals. The test pattern generation is a high level method based on signal transition graph. The effectiveness of the proposed test environment is shown by experimental results on a set of benchmarks given in the form of templates.