Old Web
English
Sign In
Acemap
>
Paper
>
Hard Disk Top Layer Analysis by Total Reflection X-Ray Photoelectron Spectroscopy (TRXPS)
Hard Disk Top Layer Analysis by Total Reflection X-Ray Photoelectron Spectroscopy (TRXPS)
2012
Abbas Alshehabi
Nobuharu Sasaki
Jun Kawai
Keywords:
Crystallography
X-ray photoelectron spectroscopy
Total internal reflection
Analytical chemistry
Chemistry
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]