X-ray photoelectron spectroscopy imaging of laser ablated poly(ether imide)

Abstract Laser ablated samples of poly(ether imide) were analyzed by XPS-imaging and by small area X-ray photoelectron spectroscopy (XPS). XPS-imaging was capable of detecting concentration variations of the order of 1.5% and revealed a relatively homogeneous deposition of carbon soot around the laser-ablated hole. A clear modification of the poly(ether imide) by the laser irradiation was determined within the laser-ablated hole by small area XPS. While the relative carbon content of the polymer was increased, the nitrogen and oxygen content was reduced.