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Precision Local Electrical Probing: Potential for the Analysis of Nanocontacts and Nanointerconnects
Precision Local Electrical Probing: Potential for the Analysis of Nanocontacts and Nanointerconnects
2013
B Guenther
J. Koeble
J. Chróst
M. Maier
C. M. Schneider
A. Bettac
Albrecht Feltz
Keywords:
Nanotechnology
Materials science
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