Measurement System of Solar Cells Based on PCI High-speed Data Acquisition Card

The system used electronic load dynamic test method and the compensatory principle,16 bits of peripheral component interconnect high-speed data acquisition card to collect the high-speed parameters such as initial current,voltage,light intensity,use Atmega16 to collect the low-speed parameters such as environment temperature.Then these parameters Will be transferred to a PC for computing and correction,it can get standard IV curve and other relevant parameters in application software.The system has high accuracy,automation,reliability and good repeatability.