waveguides is limited in some

Abstract Two methods for measuring the photorefractive susceptibility of LiNb03 waveguides are reviewed. Data for waveguides formed by means of Ti indiffusion and also by proton exchangetechniques are discussed. The photorefractive effect in channel -waveguide devices is analyzed by means of a model which accurately predicts the time evolution of photorefrac-tive effects. The response of guided -wave Mach -Zehnder interferometers is experimentallyevaluated, and the magnitudes of the photovoltaic and photoconductive components which com-prise the photorefractive effect are quantitatively determined. While these initial resultswere obtained for channel -waveguide devices, the model is believed to be extendable to planar -waveguide devices as well.IntroductionThe utility of Ti- indiffused LiNb03 waveguides is limited in some applications by a temp-oral instability due to photorefractive effects.1.2 These effects in LiNb03 have been known since 1966.1 Yet even today, the characterization and reduction of photorefractive