Highly oriented EuO nanocrystalline films via reduction process - NIR optical response

We demonstrate the preparation of high quality nanocrystalline textured EuO thin films using a non-conventional approach consisting of an in-situ reduction from a pure Eu2O3 bulk ceramic target, in vacuum and at room temperature. The films present a complete reduction to EuO, as demonstrated by a strong signal from Eu2+ in the X-ray photoelectron spectra. Furthermore, the X-ray diffraction spectrum shows only the presence of a well-defined peak corresponding to the EuO phase textured along the (110) direction. Analysis of the peak indicates that the films are nanocrystalline with an average crystallite size of 11 nm. The films show a ferromagnetic behavior below 70 K, and an excellent transparency and high refractive index in the near infrared. Deposition of EuO by reduction from Eu2O3 in vacuum is a facile and efficient method to obtain high quality and high purity EuO films suitable for spintronics and optoelectronic applications.