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Measurement of plasma emission profiles in the range from 800 - 1000 nm for ZEFF-analysis in ASDEX
Measurement of plasma emission profiles in the range from 800 - 1000 nm for ZEFF-analysis in ASDEX
1986
H. Röhr
K.-H. Steuer
D. Meisel
H. Murmann
G. Becker
H.-S. Bosch
H. Brocken
A. Eberhagen
G. Fußmann
O. Gehre
J. Gernhardt
G. von Gierke
E. Glock
O. Gruber
G. Haas
J. Hofmann
A. Izvozchikov
G Janeschitz
F. Karger
M. Keilhacker
O. Klüber
M. Kornherr
K. Lackner
M. Lenoci
G. Lisitano
F. Mast
H. M. Mayer
K. McCormick
V. Mertens
E. Müller
H. Niedermeyer
A Pietrzyk
W. Poschenrieder
H. Rapp
J Roth
F. Ryter
F. Schneider
C. Setzensack
G. Siller
P. Smeulders
F. X. Söldner
F. Wagner
D. Zasche
Keywords:
Plasma
Analytical chemistry
Chemistry
Materials science
Atomic physics
Correction
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