Observation and analysis of self-amplified spontaneous emission at the APS low-energy undulator test line

Abstract Exponential growth of self-amplified spontaneous emission at 530 nm was first experimentally observed at the Advanced Photon Source low-energy undulator test line in December 1999. Since then, further detailed measurements and analysis of the results have been made. Here, we present the measurements and compare these with calculations based on measured electron beam properties and theoretical expectations.