TID and SEE Characterizations of New Radiation-Hardened Bipolar Operational Amplifiers

G. Chaumont,Benoit Cornanguer,Patrick Briand,Christophe Prugne,Florence Malou

TID and SEE Characterizations of New Radiation-Hardened Bipolar Operational Amplifiers

2009

G. Chaumont
Benoit Cornanguer
Patrick Briand
Christophe Prugne
Florence Malou

New radiation-hardened operational amplifiers have been ELDRS and SEE characterized. This paper presents the TID results at high and low dose rates up to 300 krad(Si) and the SEE test results.

Keywords:

Electrical engineering
Space technology
Engineering
Absorbed dose
Voltage
Electronic engineering
Operational amplifier
Radiation
Bandwidth (signal processing)
Optoelectronics
aerospace instrumentation
transient analysis
low dose
single event effect

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