Radiation testing results of COTS based space microcircuits

P. Layton,H Anthony,R. Boss,N. Hall,P. Hsu,C. Land,F Meraz,C. LePage-Woodie,J. Luy,D Strobel

Radiation testing results of COTS based space microcircuits

1997

P. Layton
H Anthony
R. Boss
N. Hall
P. Hsu
C. Land
F Meraz
C. LePage-Woodie
J. Luy
D Strobel

Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs.

Keywords:

Field-programmable gate array
Space technology
Dosimetry
Electrical engineering
Engineering
Absorbed dose
Radiation
Single event upset
Commercial off-the-shelf
Electronic engineering
Microelectronics
aerospace electronics
radiation testing
aerospace testing
Embedded system

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