In situ surface X-ray diffraction using high-energy synchrotron radiation: studies of the ADP (100) and (101) growth interfaces under aqueous solution flow conditions
1993
Using the cell, preliminary surface diffraction data have been recorded from the (101) and (100) crystal/solution interfaces of nearly perfect crystals of ammonium dihydrogen orthophosphate during growth and dissolution experiments under aqueous solution flow conditions. The measurements of the X-ray rocking curves during the growth of these faces provide further evidence that the X-ray diffraction peak width depends on the growth conditions and that this technique is capable of assessing structural changes in the crystal surface during growth.
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