Transient field measurements on56Fe- and80Se-ions using segmented Fe-layers

Measurements of transient magnetic fields (TF) were performed on swift heavy ions of56Fe and80Se, with Coulomb excitation of their first 2+ state as probe, traversing thin Fe layers with segmented and unsegmented structures. The 50 µm×50 µm squares of the segments were accomplished applying the techniques of photolithography and ion etching. The magnitude of the TF deduced clearly shows that by segmentation of the targets the ion beam induced attentuations can be eliminated. This finding has direct applications tog-factor measurements.