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X-ray Reflectivity and Total-Reflection Fluorescence Analysis of Amorphous SiO2/Ta2O5 Thin Films
X-ray Reflectivity and Total-Reflection Fluorescence Analysis of Amorphous SiO2/Ta2O5 Thin Films
2004
Wei Der Chang
Hsueh-Hsing Hung
Tang-Eh Dann
Tung-Wuu Huang
Shiou–Yun Wu
Keywords:
Condensed matter physics
Thin film
Amorphous solid
Fluorescence
Nuclear magnetic resonance
X-ray reflectivity
Total internal reflection
Physics
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