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Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
1998
Michio Tajima
Y Kumagaya
Toshitake Nakata
M. Inoue
Akira Nakamura
Keywords:
Spectroscopy
Photoluminescence
Metallurgy
Materials science
Vanadium
Getter
deep level
Optoelectronics
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