Thickness dependent optical properties of MoS2 thin films probed by spectroscopic ellipsometry

Gobinda Pradhan,Rahul Kesarwani,Alika Khare,Ashwini K. Sharma

Thickness dependent optical properties of MoS2 thin films probed by spectroscopic ellipsometry

2016

Gobinda Pradhan
Rahul Kesarwani
Alika Khare
Ashwini K. Sharma

Bilayer and multilayer MoS2 films have been prepared by pulsed laser deposition technique. Spectroscopic ellipsometry spectra have been fitted with Tauc- Lorentz dispersion model. The fitting reveals thickness dependent band gap of MoS2 thin films.

Keywords:

Raman spectroscopy
Ellipsometry
Optoelectronics
Thin film
Physics
Refractive index
Bilayer
Dispersion (optics)
Pulsed laser deposition
Band gap
Spectral line

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