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Non-invasive, real-time measurements of plasma parameters with an industry standard spectrograph
Non-invasive, real-time measurements of plasma parameters with an industry standard spectrograph
2012
Shicong Wang
Amy E. Wendt
John B. Boffard
Chun C. Lin
Svetlana Radovanov
Harold M. Persing
Keywords:
Optics
non invasive
industry standard
Materials science
Plasma parameters
Spectrograph
Correction
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