Simulation of Conductive Atomic Force Microscopy of Organic Photovoltaics by Dynamic Monte Carlo Method

Morphology is one of key factors to improve performances of organic photovoltaics, and further understanding is required. Conductive atomic force microscopy, C-AFM, is an experimental technique that can observe morphologies in high resolution, but it is difficult to obtain three-dimensional information. In this study, dynamic Monte Carlo method is employed to simulate C-AFM of morphologies, which agrees experiments. Simulation will help to predict three-dimensional morphologies from experimental data.