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TEM study of crystalline defects in GaAs/(Ca,Sr)F2/GaAs grown by molecular beam epitaxy
TEM study of crystalline defects in GaAs/(Ca,Sr)F2/GaAs grown by molecular beam epitaxy
2020
Hélène Héral
A. Rocher
Chantal Fontaine
Antonio Munoz-Yague
Keywords:
Optoelectronics
Molecular beam epitaxy
Crystal
Materials science
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