CIX: a detector for spectrally enhanced x-ray imaging by simultaneous counting and integrating
2008
A hybrid pixel detector based on the concept of simultaneous charge integration and photon counting will be presented.
The second generation of a counting and integrating X-ray prototype CMOS chip (CIX) has been operated with different
direct converting sensor materials (CdZnTe and CdTe) bump bonded to its 8x8 pixel matrix. Photon counting devices
give excellent results for low to medium X-ray fluxes but saturate at high rates while charge integration allows the
detection of very high fluxes but is limited at low rates by the finite signal to noise ratio. The combination of both signal
processing concepts therefore extends the resolvable dynamic range of the X-ray detector. In addition, for a large region
of the dynamic range, where counter and integrator operate simultaneously, the mean energy of the detected X-ray
spectrum can be calculated. This spectral information can be used to enhance the contrast of the X-ray image. The
advantages of the counting and integrating signal processing concept and the performance of the imaging system will be
reviewed. The properties of the system with respect to dynamic range and sensor response will be discussed and
examples of imaging with additional spectral information will be presented.
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