Microwave dielectric properties and microstructures of Nd(Mg0.5Sn0.5−xTix)O3 ceramics

Abstract This study elucidates the microwave dielectric properties and microstructures of Nd(Mg 0.5 Sn 0.5− x Ti x )O 3 ceramics with a view to their potential for microwave devices. The Nd(Mg 0.5 Sn 0.5− x Ti x )O 3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg 0.5 Sn 0.4 Ti 0.1 )O 3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant ( ɛ r ) of 21.1, a quality factor (Q × f) of 50,000 GHz, and a temperature coefficient of resonant frequency ( τ f ) of −60 ppm/°C were obtained for Nd(Mg 0.5 Sn 0.4 Ti 0.1 )O 3 ceramics that were sintered at 1550 °C for 4 h.