Magnetic properties of nanocrystalline FeNiN thin films

FeNiN thin films with a Ni content varying between 5 and 36 at% (as determined by X-ray photoelectron spectroscopy) have been deposited in a Dual Ion Beam Sputtering System at room temperature. The structure and crystalline size were studied by X-ray diffraction while the magnetic properties were investigated by vectorial kerr magnetometry. In general, the deposited films present a nanocrystaline cubic structure and well defined in-plane magnetic anisotropy. The variation of the magnetic properties was attributed to changes in composition and nanocrystalline structure. FeNiN thin films with a Ni content of about 15 at% show the better soft magnetic properties with a minimum in the coercivity of 9 Oe.