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Thermal transport in a semiconductor heterostructure measured by time-resolved x-ray diffraction
Thermal transport in a semiconductor heterostructure measured by time-resolved x-ray diffraction
2008
Y. M. Sheu
Sooheyong Lee
J. K. Wahlstrand
Donald A. Walko
Eric C. Landahl
D. A. Arms
M. Reason
R. S. Goldman
David A. Reis
Keywords:
Thermal
Heterojunction
X-ray crystallography
Thermal stability
Molecular beam epitaxy
Nuclear magnetic resonance
Thermal conductivity
Semiconductor
Physics
thermal transport
Condensed matter physics
Correction
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