Far-Infrared and Raman Studies of Semiconductor Superlattices

The experimental techniques of Raman spectroscopy and far-infrared (FIR) Fourier-transform spectroscopy have been applied to a range of semiconductor superlattice specimens. Both resonant and non-resonant Raman scattering are available, and the Fourier-transform techniques include normal-incidence dispersive Fourier-transform spectroscopy (DFTS), attenuated total-reflection (ATR) spectroscopy, and oblique-incidence power Fourier-transform spectroscopy (FTS).