On the electrical resistivity of evaporated thin cobalt films; an approach based on the Mayadas-Shatzkes model

Abstract The electrical resistivity model for polycrystalline films proposed by Mayadas and Shatzkes, is applied to experimental data from thin cobalt films condensed at 77°K. The results obtained with layers annealed at temperatures lower than 373°K, which cannot be fitted to the simple Fuchs-Sondheimer model are interpreted assuming that crystallite size is exactly equal to film thickness. The adjustable reflection parameter r of the model is found to be thickness dependent.