X-ray Reflectivity Studies of Twist Grain Boundaries

Artificial grain boundaries in bicrystals are buried interfaces which are well suited for studies with the techniques of X-ray reflectivity. Measurements of the specular and non-specular reflectivity from different An samples indicate that the single-crystal films and, also, the grain boundaries in the formed bicrystal specimens are rough. The roughness of the grain boundary depends on the geometrical orientation of the single crystal substrate. The diffuse scattering was shown to originate from the grain boundary with the in situ study of the growth and destruction of the grain boundary. Our observations suggest that X-ray reflectivity is well suited to continously monitor the formation of a grain boundary.