Testbench qualification for SystemC-AMS timed data flow models

Analog-Mixed Signal (AMS) circuits have become increasingly important for today's SoCs. The Timed Data Flow (TDF) model of computation available in SystemC-AMS offers here a good tradeoff between accuracy and simulation-speed at the system-level. One of the main challenges in system-level verification is the quality of the testbench. In this paper, we present a testbench qualification approach for SystemC-AMS TDF models. Our contribution is twofold: First, we propose specific mutation models for the class of filters implemented as TDF models. This requires to analyze the Laplace transfer function of the filter design. Second, we present the mutation-based qualification approach based on the proposed specific mutations as well as standard behavioral mutations. This allows to find serious quality issues in the testbench. Our experimental results for a real-world AMS system demonstrate the applicability and efficacy of our approach.