Characterization of Fabricated Array type Si-PIN Photodiode for Cargo Inspection System
2019
Array type Si-PIN photodiodes were fabricated for radiation imaging of X-ray/neutron security inspection system. Device fabrication process is described and electrical, optical characteristics were characterized. Test image was feasible with in-house fabricated Si-PIN photodiode attached to developed read-out circuit.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
2
References
1
Citations
NaN
KQI