Old Web
English
Sign In
Acemap
>
Paper
>
The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDs (vol 204, pg 175, 2003)
The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDs (vol 204, pg 175, 2003)
2005
Ambrosi
Smith
A. F. Abbey
Ian B. Hutchinson
E. Kendziorra
A. Short
A.D. Holland
M. J. L. Turner
Alan A. Wells
Keywords:
EPIC
Nanotechnology
Atomic physics
Proton
Chemistry
Molecular physics
low energy
Nuclear physics
Computer science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
2
Citations
NaN
KQI
[]