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A Test Structure for Analysis of Asymmetry and Orientation Dependence of MOSFETs
A Test Structure for Analysis of Asymmetry and Orientation Dependence of MOSFETs
2007
Toshihiro Matsuda
Yuya Sugiyama
Hideyuki Iwata
Takashi Ohzone
Keywords:
Condensed matter physics
MOSFET
Physics
Asymmetry
drain current
test structure
Correction
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