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4H-SiC{03-38}面上のMOSデバイスの電気的特性評価
4H-SiC{03-38}面上のMOSデバイスの電気的特性評価
2012
Hiyoshi Tooru
Masuda Takeyoshi
Wada Keiji
Harada Makoto
Namikawa Yasuo
Keywords:
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