Simultaneous determination of the constituents in Al-Ge-Si alloys by inductively coupled plasma atomic emission spectrometry.

An accurate method for determination of the constituents Ge, Si, In and Mg in Al–Ge–Si based compact alloys and foil materials by ICP atomic emission spectrometry is developed. The material samples were dissolved in nitric acid–hydrofluoric acid. Optimum parameters for the simultaneous measurement of the constituent elements are worked out. To compensate the time determined sensitivity fluctuations the analytical signal was corrected by a special procedure of external standardization.