Direct Chemical Analysis of Solids by Laser Ablation in an Ion Storage Time-of-Flight Mass Spectrometer

A laser ablation/ionization mass spectrometer system is described for the direct analysis of solids, particles, and fibers. The system uses a quadrupole ion trap operated in an ion storage mode, coupled with a reflectron time-of-flight mass spectrometer). The sample is inserted radially into the ring electrode, and an imaging system allows direct viewing and selected analysis of the sample. Measurements identified trace contaminants of Ag, Sn, and Sb in a Pb target with single laser shot experiments. Resolution (m/Δm) of 1500 and detection limits of ∼10 pg have been achieved with a single laser pulse. The system configuration and related operating principles for accurately measuring low concentrations of isotopes are described.