Old Web
English
Sign In
Acemap
>
Paper
>
PRINCIPES OF AND A NEW SYSTEM FOR X-RAY FLUORESCENCE COATING THICKNESS MEASUREMENTS
PRINCIPES OF AND A NEW SYSTEM FOR X-RAY FLUORESCENCE COATING THICKNESS MEASUREMENTS
1994
S. S. Smith
A. F. Griesser
T. H. Cook
Keywords:
Chemistry
Inorganic chemistry
Coating
Analytical chemistry
X-ray fluorescence
Metallurgy
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]