Counting‐loss correction method based on dual‐exponential impulse shaping

Under the condition of high counting rate, the phenomenon of nuclear pulse signal pile-up using a single exponential impulse shaping method is still very serious, and leads to a severe loss in counting rate. A real nuclear pulse signal can be expressed as a dual-exponential decay function with a certain rising edge. This paper proposes a new dual-exponential impulse shaping method and shows its deployment in hardware to test its performance. The signal of a high-performance silicon drift detector under high counting rate in an X-ray fluorescence spectrometer is obtained. The result of the experiment shows that the new method can effectively shorten the dead-time caused by nuclear signal pile-up and correct the counting rate.