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Electrical Screening Method of VNAND Flash Channel Hole Bending Defects
Electrical Screening Method of VNAND Flash Channel Hole Bending Defects
2021
Dooyeun Jung
Youngha Choi
Jae In Lee
Bu-il Nam
Ki-Young Dong
Boh-Chang Kim
Eun-Kyoung Kim
Ki-whan Song
Jai Hyuk Song
Myung Suk Kim
Woo Young Choi
Keywords:
Optoelectronics
Bending
screening method
Communication channel
flash
Materials science
Correction
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