Scanning Probe Microscopy (SPM)

This chapter focuses on the SPM techniques that can be useful for the study of soft interface sciences. Different from the optical and electron microscopes, the SPM has no requirements on light source and lens, and therefore, the resolution has no limitation due to the wavelength of light and optical aberration. One of the most impressive features of SPM is versatility of detecting conditions: there is no requirement of vacuum condition, which is conventionally necessary for the electron microscopic techniques, and SPM works not only at an ambient condition but also in solution and at elevated temperatures. Therefore, SPM is applicable to characterize the surface features of soft materials including topography, friction, electron density of states, interaction force, and so on. This chapter provides brief overviews of SPM and illustrates its application for the study of soft materials.