Simultaneous monitoring of molecular thin film morphology and crystal structure by X-ray scattering

Nada Mrkyvkova,Peter Nadazdy,Martin Hodas,Jianwei Chai,Shijie Wang,Dongzhi Chi,M. Sojková,Martin Hulman,Andrei Chumakov,Oleg Konovalov,Alexander Hinderhofer,Matej Jergel,Eva Majkova,Peter Siffalovic,Frank Schreiber

Simultaneous monitoring of molecular thin film morphology and crystal structure by X-ray scattering

2020

Nada Mrkyvkova
Peter Nadazdy
Martin Hodas
Jianwei Chai
Shijie Wang
Dongzhi Chi
M. Sojková
Martin Hulman
Andrei Chumakov
Oleg Konovalov
Alexander Hinderhofer
Matej Jergel
Eva Majkova
Peter Siffalovic
Frank Schreiber

Hybrid materials of π-conjugated molecular semiconductors combined with 2D materials exhibit significant potential for novel (opto)electronics. The overall characteristics of molecular growth, such...

Keywords:

Crystal structure
Crystallography
Optoelectronics
X-ray
Semiconductor
Hybrid material
Electronics
Chemistry
thin film morphology
Scattering

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