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Quantitative two-dimensional Carrier Profiling Using MIS Tunneling Microscopy
Quantitative two-dimensional Carrier Profiling Using MIS Tunneling Microscopy
2000
S. Richter
Michael Geva
J. P. Garno
R.N. Kleiman
Keywords:
Electrochemical scanning tunneling microscope
Conductive atomic force microscopy
Atomic force microscopy
Microscopy
Analytical chemistry
Photoconductive atomic force microscopy
Quantum tunnelling
Kelvin probe force microscope
Materials science
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