Fabrication of High-Jc YBCO Tapes Using Continuously Deposited YSZ Buffer Layers by IBAD method

High-Jc YBCO thin film tapes were fabricated on flexible tapes of Ni-based alloy(1.0 cm width, 0.2 mm thick), with biaxially aligned structure (c-axis aligned normal, and a-b basal plane also aligned), which was formed by using ion-beam-modified YSZ buffer layers. By optimization of YBCO growth conditions, Jc value of 1.13×l06A/cm2(77K, 0T) was obtained in a short sample with measured length of 1 cm., and Jc of 1. 1 x 105 A/cm2 were obtained at 77 K,5.0T (B⊥c, B⊥I). Smooth morphology of YBCO surface was observed and big YBCO grains (>2.0nm) were grown on flat YSZ surface. Biaxially aligned YBCO tapes of 0.8 m long were fabricated on flexible Ni-based alloy with continuously deposited YSZ buffer layers by IBAD method. Jc values over 105 A/cm2 was obtained in measured length of 0.76 m, without violent Jc distributions.