Temperature dependent Raman scattering and dielectric permittivity measurements of Pb 1-xSr xTiO 3 films

Pb1-x Srx TiO3 (x = 0 to 1.0) films of thickness ∼ 4 μ m have been prepared on sapphire and Pt substrates by metalorganic decomposition (MOD) method. X-ray diffraction results show that the films are polycrystalline with a perovskite tetragonal phase at room temperature for x 0.5. Room temperature Raman spectra show a systematic variation of lattice vibrational modes with x. The most notable changes in the Raman spectra with x are the decrease in the splitting of A1(3TO) and E(3TO) modes and the disappearance of E(3TO) mode at x ∼ 0.6. Although the x-ray diffraction peaks for films with x > 0.5 show a cubic phase at room temperature, the Raman spectra show the characteristic phonon modes of a tetragonal phase even at x = 0.7. The dielectric permittivity versus temperature measurements for films with x ≤ 0.7 show a broad dielectric anomaly corresponding to a diffuse ferroelectric to paraelectric phase transition. The phase transition temperature (Tc) values are consistently lower than the corresponding bulk ceramic alloys. Furthermore, Tc are also determined by monitoring the temperature dependence of the splitting between E(3TO) and A1(3TO) phonon modes in the Raman spectra of Pb1-x Srx TiO3 films for x ≤ 0.6. There has been good agreement between the two methods.