Improving Cost of Ownership on KLA-Tencor Wafer Fab Reticle Inspections by Implementing Pixel Migration via New STARlight2+ Capability
2008
In the ever-changing semiconductor industry, wafer fabs and mask shops alike are adding low
cost of ownership (CoO) to the list of requirements for inspections tools. KLA-Tencor has
developed and introduced STARlight2+ (SL2+) to satisfy this need. This new software
algorithm is available on all TeraScanHR and TeraFab models. KLA-Tencor has cooperated
with United Microelectronics Corporation (UMC) to demonstrate and improve SL2+, including
its ability to lower CoO, on 65nm and below photomasks.
These improvements are built on the rich history of STARlight. Over the years, STARlight has
become one of the industry standards for reticle inspection. Like its predecessors, SL2+ uses
only transmitted and reflected light images from a reticle to identify defects on the reticle. These
images along with plate-specific information are then processed by SL2+ to generate reference
images of how the patterns on the reticle should appear. These reference images are then
compared with the initial optical images to identify the defects.
The new and improved SL2+ generates more accurate reference images. These images reduce
background noise and increase the usable sensitivity. With the results from controlled
engineering tests, a fab or mask shop can then decide to inspect reticles at a given technology
node with a large pixel; this is sometimes referred to as pixel migration. The larger pixel with
SL2+ can then perform the inspections at similar sensitivity settings and higher throughput, thus
lowering CoO.
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