Power MOSFET single event burnout hardness increasing by neutron preirradiation

L.N. Kessarinskiy,D. V. Boychenko,A.Y. Nikiforov,A. Polokhov,T. Kritskaya,G. G. Davydov

Power MOSFET single event burnout hardness increasing by neutron preirradiation

2017

L.N. Kessarinskiy
D. V. Boychenko
A.Y. Nikiforov
A. Polokhov
T. Kritskaya
G. G. Davydov

Commercial MOSFET SEB hardness increase method is discussed. Samples subjected to preliminary neutron irradiation show increased SEB hardness than initial ones.

Keywords:

Burnout
Electronic engineering
Power MOSFET
Computer science
MOSFET
Neutron
Ion
Engineering physics
single event burnout
neutron irradiation
electric breakdown

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