Creep in nanocrystalline Ni during X-ray diffraction
2009
Stress-dip experiments followed by creep have been performed on nanocrystalline Ni during in situ X-ray diffraction. The signatures of the peak profile at different creep stress levels demonstrate the presence of a creep mechanism that broadens the diffraction peak width and of a creep mechanism that reduces the peak width. The balance between the two mechanisms is discussed in terms of the applied creep stress.
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