Device for detecting thickness of sapphire wafer

The utility model relates to the field of sapphire processing and detection equipment and in particular relates to a device for detecting the thickness of a sapphire wafer. The device comprises detection conveyor belts, wherein two detection conveyor belts are arranged; a detection platform is arranged between the two detection conveyor belts and is connected with the detection conveyor belts end to end; the height of the detection platform is consistent with the upper surface of each detection conveyor belt; a height detector is arranged at one end, which is opposite to the rear of the conveying direction of the detection conveyor belts, of the detection platform; and a separation device is arranged on the detection platform in front of the height detector. According to the device for detecting the thickness of the sapphire wafer, the thickness of the sapphire wafer is automatically detected, the detection efficiency is high, automatic separation can be realized, and the service performance is excellent. Meanwhile, the detection precision is high, and the detection leakage rate is zero.