Observation of Energy-Filtered Image for X-Ray Photoemission Electron Microscopy (EXPEEM) Using a Retarding Wien-Filter Energy Analyzer.

We observed surface images of the Au islands periodically deposited on a Ta sheet by means of an energy-filtered XPEEM using a retarding Wien-filter energy analyzer and a high energy X-ray. By changing the passing photoelectron kinetic energy (Ekin), we had a brighter Au island image at the Ekin=0 eV and 60 eV while we had a brighter Ta substrate image at Ekin=102 eV, corresponding to a Ta 3p3/2 photoelectron peak.